The Bruker Dimension ICON AFM-IR is a scanning probe microscope combining AFM with IR spectroscopy which produces nano-scale chemical maps and FTIR-like spectra. It does this by measuring the nanoscale expansion of a material as it absorbs IR light of different wavelengths. A graph of this expansion vs. frequency behavior is essentially identical to an FTIR absorption plot. The system can scan samples with diameters up to 150 mm and thicknesses of 20 mm.

Specifications:

• Maximum Z-range: 13 microns
• Maximum X-Y scan size: 90 microns
• Z-resolution: 40 pm
• Scanning range for spectra: 900 to 1862 cm-1
   

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